Materials characterisation by light scattering and reflectometry

 

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Surfoptic Imaging Reflectometer

 

The Surfoptic Imaging Reflectometer System (SIRS 75) is an instrument for quantitative analysis of surface reflectance and appearance. It offers a unique combination of data which not only describe surface reflectance properties like gloss, but also provide insights into the physical surface properties controlling the observed reflectance such as roughness and refractive index.

 

Please follow the links above for further information.

 

 

Index_SIRS75

 

 

 

 

 

 

 

Dayta Systems Ltd 2011

 

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